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dc.contributor.authorAydoğdu, Y.
dc.contributor.authorYakuphanoğlu, F.
dc.contributor.authorDağdelen, F.
dc.contributor.authorŞekerci, M.
dc.contributor.authorAksoy, I.
dc.date.accessioned2020-06-25T17:34:58Z
dc.date.available2020-06-25T17:34:58Z
dc.date.issued2002
dc.identifier.citationclosedAccessen_US
dc.identifier.issn0167-577X
dc.identifier.urihttps://doi.org/10.1016/S0167-577X(02)00772-3
dc.identifier.urihttps://hdl.handle.net/20.500.12587/2971
dc.descriptionDagdelen, Fethi/0000-0001-9849-590X;en_US
dc.descriptionWOS: 000179186600045en_US
dc.description.abstractThe crystal structure, microstructure and electrical properties of the Fe(II) complex including sodium oxalate ligand (Na2C2O4) have been investigated. X-ray diffraction data shows that the sample is triclinic with the cell parameters a = 4.8283 Angstrom, b = 3.9195 Angstrom, c = 12.7633 Angstrom, beta = 97.818degrees and cell volume V = 239.30 Angstrom(3). The do conductivities have been measured as a function of temperature. It is seem that this sample has inorganic semiconductor property. (C) 2002 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoengen_US
dc.publisherElsevier Science Bven_US
dc.relation.isversionof10.1016/S0167-577X(02)00772-3en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectcomplexen_US
dc.subjectsodium oxalateen_US
dc.subjectsemiconductoren_US
dc.subjectelectrical propertiesen_US
dc.titleX-ray diffraction study and electrical properties of the metal complex Fe(II) including sodium oxalate ligand (Na2C2O4)en_US
dc.typearticleen_US
dc.contributor.departmentKırıkkale Üniversitesien_US
dc.identifier.volume57en_US
dc.identifier.issue1en_US
dc.identifier.startpage237en_US
dc.identifier.endpage241en_US
dc.relation.journalMaterials Lettersen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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