Step-stress life-testing under tampered random variable modeling for Weibull distribution in presence of competing risk data

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Tarih

2024

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

Wiley

Erişim Hakkı

info:eu-repo/semantics/closedAccess

Özet

In this paper, we have considered the classical and Bayesian inference of the unknown parameters of the lifetime distribution based on the observations obtained from a simple step-stress life-testing (SSLT) experiment and when more than one cause of failures are observed. We have used the Tampered Random Variable (TRV) approach. The main advantage of the TRV approach is that it can be easily extended to a multiple step-stress model as well as for different lifetime distributions. In this paper, it is assumed that the lifetime of the experimental units at each stress level follows Weibull distribution with the same shape parameter and different scale parameters. Further, we have introduced different tempering co-efficient for different causes of failures. The maximum likelihood estimators and the associated asymptotic confidence intervals are obtained based on Type-II censored observations. Further, we have considered the Bayesian inference of the unknown model parameters based on a fairly general class prior distributions. An extensive simulation study is performed to examine the performances of the proposed method, and the analysis of a real data set has been provided to show how the method can be used in practice. We have compared the TRV model with some of the other existing models, and the TRV model provides a better fit in terms of information theoretic criteria. We have also provided some optimality criteria, to determine the optimal stress change time and some sensitivity analyses have been performed. Most of the methods can be extended for other lifetime distributions also.

Açıklama

Anahtar Kelimeler

baseline lifetime; Bayesian analysis; competing risk; maximum likelihood estimation; tampered random variable modeling; tampering coefficients

Kaynak

Quality and Reliability Engineering International

WoS Q Değeri

Q2

Scopus Q Değeri

Q2

Cilt

40

Sayı

3

Künye