Automatic Landmark Detection through Circular Hough Transform in Cephalometric X-rays

Basit Öğe Kaydı
dc.contributor.authorDuman, Elvan
dc.contributor.authorKokver, Yunus
dc.contributor.authorUnver, Halil Murat
dc.contributor.authorErdem, Osman Ayhan
dc.date.accessioned2020-06-25T18:23:20Z
dc.date.available2020-06-25T18:23:20Z
dc.date.issued2017
dc.departmentKırıkkale Üniversitesi
dc.description10th International Conference on Electrical and Electronics Engineering (ELECO) -- NOV 30-DEC 02, 2017 -- Bursa, TURKEY
dc.descriptionKOKVER, YUNUS/0000-0002-9864-2866; Erdem, Ayhan/0000-0001-7761-1078
dc.description.abstractIn this paper, a knowledge based framework is proposed to detect automatically cephalometric landmarks: Porion (Po), Sella (S), Menton (Me), Pogonion (Pg) and Gnathion (Gn). In this way anomalies can be diagnosed easily by orthodontists. Our framework comprise of two main steps: (1) Adaptive Histogram Equalisation (AHE) is applied to clarify the image which is used to determine the method of treatment in orthodontics and obtained from the plain X-ray. (2) Circular Hough Transform method is used to locate the cephalometric landmarks automatically on the processed image, the method was tested on 7 cephalometric images and our framework accurately and automatically locates these 5 cephalometric landmarks.en_US
dc.description.sponsorshipChamber Elect Engineers Bursa Sect Branch, Uludag Univ, Fac Engn, Dept Elect & Elect Engn, Istanbul Tech Univ, Fac Elect & Elect Engn, Sci & Technolog Res Council Turkey, IEEE Turkey Secten_US
dc.identifier.citationclosedAccessen_US
dc.identifier.endpage587en_US
dc.identifier.isbn978-1-5386-1723-6
dc.identifier.scopus2-s2.0-85046285270
dc.identifier.scopusqualityN/A
dc.identifier.startpage583en_US
dc.identifier.urihttps://hdl.handle.net/20.500.12587/7071
dc.identifier.wosWOS:000426978800096
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherIeeeen_US
dc.relation.ispartof2017 10Th International Conference On Electrical And Electronics Engineering (Eleco)
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleAutomatic Landmark Detection through Circular Hough Transform in Cephalometric X-raysen_US
dc.typeConference Object

Dosyalar

Orijinal paket
Listeleniyor 1 - 1 / 1
[ X ]
İsim:
Automatic Landmark Detection through Circular Hough Transform in Cephalometric X-rays.pdf
Boyut:
1.06 MB
Biçim:
Adobe Portable Document Format
Açıklama:
Tam Metin/Full Text
İndir

Koleksiyon

WOS İndeksli Yayınlar Koleksiyonu
Bildiri ve Sunum Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu